Bismuth layer properties in the ultrathin Bi–FeNi multilayer films probed by spectroscopic ellipsometry
Applied physics letters, 2021-11, Vol.119 (18) [Peer Reviewed Journal]Author(s) ;2021 Author(s). Published under an exclusive license by AIP Publishing. ;ISSN: 0003-6951 ;EISSN: 1077-3118 ;DOI: 10.1063/5.0069691 ;CODEN: APPLAB
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