Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials
Science (American Association for the Advancement of Science), 2018-02, Vol.359 (6376), p.675-679 [Peer Reviewed Journal]Copyright © 2018 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. ;Copyright © 2018 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works ;ISSN: 0036-8075 ;EISSN: 1095-9203 ;DOI: 10.1126/science.aao0865 ;PMID: 29348363
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