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1
Effect of substrate temperature on the stability of transparent conducting cobalt doped ZnO thin films
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Effect of substrate temperature on the stability of transparent conducting cobalt doped ZnO thin films

Journal of semiconductors, 2012-09, Vol.33 (9), p.18-21 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/9/093001

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2
Photoelectric properties of Cu2ZnSnS4 thin films deposited by thermal evaporation
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Photoelectric properties of Cu2ZnSnS4 thin films deposited by thermal evaporation

半导体学报, 2012-02, Vol.33 (2), p.14-17 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/2/022002

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3
Physical properties of sprayed antimony doped tin oxide thin films: The role of thickness
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Physical properties of sprayed antimony doped tin oxide thin films: The role of thickness

Journal of semiconductors, 2011-05, Vol.32 (5), p.10-17 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/32/5/053001

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4
A nanostructured copper telluride thin film grown at room temperature by an electrodeposition method
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A nanostructured copper telluride thin film grown at room temperature by an electrodeposition method

Journal of semiconductors, 2012-09, Vol.33 (9), p.22-27 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/9/093002

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5
Fluorescent SiC and its application to white light-emitting diodes
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Fluorescent SiC and its application to white light-emitting diodes

Journal of semiconductors, 2011, Vol.32 (1), p.24-26 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/32/1/013004

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6
Reliability test and failure analysis of high power LED packages
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Reliability test and failure analysis of high power LED packages

Journal of semiconductors, 2011, Vol.32 (1), p.53-56 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/32/1/014007

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7
A review of passive thermal management of LED module
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A review of passive thermal management of LED module

Journal of semiconductors, 2011, Vol.32 (1), p.57-60 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/32/1/014008

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8
Thermal analysis and test for single concentrator solar cells
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Thermal analysis and test for single concentrator solar cells

Journal of semiconductors, 2009-04, Vol.30 (4), p.63-66 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/30/4/044011

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9
Barrier height and ideality factor dependency on identically produced small Au/p-Si Schottky barrier diodes
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Barrier height and ideality factor dependency on identically produced small Au/p-Si Schottky barrier diodes

Journal of semiconductors, 2010-07, Vol.31 (7), p.16-21 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/31/7/074001

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10
Synthesis and efficient field emission characteristics of patterned ZnO nanowires
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Synthesis and efficient field emission characteristics of patterned ZnO nanowires

Journal of semiconductors, 2012-02, Vol.33 (2), p.18-22 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/2/023001

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11
Planarization properties of an alkaline slurry without an inhibitor on copper patterned wafer CMP
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Planarization properties of an alkaline slurry without an inhibitor on copper patterned wafer CMP

Journal of semiconductors, 2012-11, Vol.33 (11), p.134-138 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/11/116001

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12
Continuous analytic I-V model for GS DG MOSFETs including hot-carrier degradation effects
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Continuous analytic I-V model for GS DG MOSFETs including hot-carrier degradation effects

Journal of semiconductors, 2012, Vol.33 (1), p.41-46 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/1/014001

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13
Dielectric response and electric properties of organic semiconducting phthalocyanine thin films
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Article
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Dielectric response and electric properties of organic semiconducting phthalocyanine thin films

Journal of semiconductors, 2012-08, Vol.33 (8), p.15-21 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/8/082002

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14
Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode
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Electrical characterization of the organic semiconductor Ag/CuPc/Au Schottky diode

Journal of semiconductors, 2011-04, Vol.32 (4), p.52-56 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/32/4/044001

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15
Effect of ZnO films on CdTe solar cells
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Effect of ZnO films on CdTe solar cells

Journal of semiconductors, 2012-09, Vol.33 (9), p.28-33 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/9/093003

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16
Characterization of vanadyl phthalocyanine based surface-type capacitive humidity sensors
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Characterization of vanadyl phthalocyanine based surface-type capacitive humidity sensors

Journal of semiconductors, 2010-11, Vol.31 (11), p.9-14 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/31/11/114002

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17
A low power 3.125 Gbps CMOS analog equalizer for serial links
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Article
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A low power 3.125 Gbps CMOS analog equalizer for serial links

Journal of semiconductors, 2010-11, Vol.31 (11), p.78-81 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/31/11/115003

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18
Low threading dislocation density in GaN films grown on patterned sapphire substrates
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Article
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Low threading dislocation density in GaN films grown on patterned sapphire substrates

Journal of semiconductors, 2012-11, Vol.33 (11), p.24-27 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/11/113002

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19
Using I-V characteristics to investigate selected contacts for SnO2:F thin films
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Using I-V characteristics to investigate selected contacts for SnO2:F thin films

半导体学报, 2012-08, Vol.33 (8), p.22-27 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/33/8/083001

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20
Surface morphology and composition studies in InGaN/GaN film grown by MOCVD
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Surface morphology and composition studies in InGaN/GaN film grown by MOCVD

Journal of semiconductors, 2011-08, Vol.32 (8), p.14-17 [Peer Reviewed Journal]

ISSN: 1674-4926 ;DOI: 10.1088/1674-4926/32/8/083002

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