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Results 1 - 20 of 18,156  for All Library Resources

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1
The k-means Algorithm: A Comprehensive Survey and Performance Evaluation
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Article
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The k-means Algorithm: A Comprehensive Survey and Performance Evaluation

Electronics (Basel), 2020-08, Vol.9 (8), p.1295 [Peer Reviewed Journal]

ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9081295

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2
Machine Learning Interpretability: A Survey on Methods and Metrics
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Article
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Machine Learning Interpretability: A Survey on Methods and Metrics

Electronics (Basel), 2019-08, Vol.8 (8), p.832 [Peer Reviewed Journal]

2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics8080832

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3
CNN Variants for Computer Vision: History, Architecture, Application, Challenges and Future Scope
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Article
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CNN Variants for Computer Vision: History, Architecture, Application, Challenges and Future Scope

Electronics (Basel), 2021-10, Vol.10 (20), p.2470 [Peer Reviewed Journal]

2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics10202470

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4
A Survey on Knowledge Graph Embedding: Approaches, Applications and Benchmarks
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Article
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A Survey on Knowledge Graph Embedding: Approaches, Applications and Benchmarks

Electronics (Basel), 2020-05, Vol.9 (5), p.750 [Peer Reviewed Journal]

ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9050750

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5
Sentiment Analysis Based on Deep Learning: A Comparative Study
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Article
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Sentiment Analysis Based on Deep Learning: A Comparative Study

Electronics (Basel), 2020-03, Vol.9 (3), p.483 [Peer Reviewed Journal]

2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9030483

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6
Early Detection of Diabetic Retinopathy Using PCA-Firefly Based Deep Learning Model
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Article
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Early Detection of Diabetic Retinopathy Using PCA-Firefly Based Deep Learning Model

Electronics (Basel), 2020-02, Vol.9 (2), p.274 [Peer Reviewed Journal]

ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9020274

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7
A Comparative Analysis of Object Detection Metrics with a Companion Open-Source Toolkit
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Article
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A Comparative Analysis of Object Detection Metrics with a Companion Open-Source Toolkit

Electronics (Basel), 2021-02, Vol.10 (3), p.279 [Peer Reviewed Journal]

2021. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics10030279

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8
A State-of-the-Art Survey on Deep Learning Theory and Architectures
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Article
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A State-of-the-Art Survey on Deep Learning Theory and Architectures

Electronics (Basel), 2019-03, Vol.8 (3), p.292 [Peer Reviewed Journal]

2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics8030292

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9
Past, Present, and Future of Face Recognition: A Review
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Article
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Past, Present, and Future of Face Recognition: A Review

Electronics (Basel), 2020-08, Vol.9 (8), p.1188 [Peer Reviewed Journal]

2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;Attribution ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9081188

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10
A Real-Time Detection Algorithm for Kiwifruit Defects Based on YOLOv5
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Article
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A Real-Time Detection Algorithm for Kiwifruit Defects Based on YOLOv5

Electronics (Basel), 2021-07, Vol.10 (14), p.1711 [Peer Reviewed Journal]

2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics10141711

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11
A Survey on Internet of Things and Cloud Computing for Healthcare
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Article
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A Survey on Internet of Things and Cloud Computing for Healthcare

Electronics (Basel), 2019-07, Vol.8 (7), p.768 [Peer Reviewed Journal]

2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics8070768

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12
Artificial Neural Networks Based Optimization Techniques: A Review
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Article
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Artificial Neural Networks Based Optimization Techniques: A Review

Electronics (Basel), 2021-11, Vol.10 (21), p.2689 [Peer Reviewed Journal]

2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics10212689

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13
A Hybrid Deep Learning-Based Approach for Brain Tumor Classification
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Article
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A Hybrid Deep Learning-Based Approach for Brain Tumor Classification

Electronics (Basel), 2022-04, Vol.11 (7), p.1146 [Peer Reviewed Journal]

2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics11071146

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14
A Novel PCA-Firefly Based XGBoost Classification Model for Intrusion Detection in Networks Using GPU
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Article
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A Novel PCA-Firefly Based XGBoost Classification Model for Intrusion Detection in Networks Using GPU

Electronics (Basel), 2020-02, Vol.9 (2), p.219 [Peer Reviewed Journal]

ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9020219

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15
A Review of Intrusion Detection Systems Using Machine and Deep Learning in Internet of Things: Challenges, Solutions and Future Directions
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Article
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A Review of Intrusion Detection Systems Using Machine and Deep Learning in Internet of Things: Challenges, Solutions and Future Directions

Electronics (Basel), 2020-07, Vol.9 (7), p.1177 [Peer Reviewed Journal]

2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9071177

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16
Evaluating the Quality of Machine Learning Explanations: A Survey on Methods and Metrics
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Article
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Evaluating the Quality of Machine Learning Explanations: A Survey on Methods and Metrics

Electronics (Basel), 2021-03, Vol.10 (5), p.593 [Peer Reviewed Journal]

2021. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics10050593

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17
Object Detection Algorithm Based on Improved YOLOv3
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Article
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Object Detection Algorithm Based on Improved YOLOv3

Electronics (Basel), 2020-03, Vol.9 (3), p.537 [Peer Reviewed Journal]

2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9030537

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18
SoC Estimation for Lithium-ion Batteries: Review and Future Challenges
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Article
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SoC Estimation for Lithium-ion Batteries: Review and Future Challenges

Electronics (Basel), 2017-12, Vol.6 (4), p.102 [Peer Reviewed Journal]

Copyright MDPI AG 2017 ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics6040102

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19
A Review of Binarized Neural Networks
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Article
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A Review of Binarized Neural Networks

Electronics (Basel), 2019-06, Vol.8 (6), p.661 [Peer Reviewed Journal]

2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics8060661

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20
CNN-Based Network Intrusion Detection against Denial-of-Service Attacks
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Article
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CNN-Based Network Intrusion Detection against Denial-of-Service Attacks

Electronics (Basel), 2020-06, Vol.9 (6), p.916 [Peer Reviewed Journal]

2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9060916

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