Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Article
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Comparison of Various Factors Affected TID Tolerance in FinFET and Nanowire FETApplied sciences, 2019-08, Vol.9 (15), p.3163 [Peer Reviewed Journal]2019. This work is licensed under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2076-3417 ;EISSN: 2076-3417 ;DOI: 10.3390/app9153163Full text available |
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2 |
Material Type: Article
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Ferroelectric Polarization Aided Low Voltage Operation of 3D NAND Flash MemoriesElectronics (Basel), 2021-01, Vol.10 (1), p.38 [Peer Reviewed Journal]2021. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics10010038Full text available |
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3 |
Material Type: Article
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Investigation of Inhibited Channel Potential of 3D NAND Flash Memory According to Word-Line LocationElectronics (Basel), 2020-02, Vol.9 (2), p.268 [Peer Reviewed Journal]ISSN: 2079-9292 ;EISSN: 2079-9292 ;DOI: 10.3390/electronics9020268Full text available |