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1
New material routes to polymeric solid electrolytes: Poster presented at Bunsen-Kolloquium "Solid-State Batteries II - From Fundamentals to Application", SSB 2016, 23.11.-25.11.2016, Frankfurt am Main, Germany
New material routes to polymeric solid electrolytes: Poster presented at Bunsen-Kolloquium "Solid-State Batteries II - From Fundamentals to Application", SSB 2016, 23.11.-25.11.2016, Frankfurt am Main, Germany
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New material routes to polymeric solid electrolytes: Poster presented at Bunsen-Kolloquium "Solid-State Batteries II - From Fundamentals to Application", SSB 2016, 23.11.-25.11.2016, Frankfurt am Main, Germany

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2
Supplementary information files for 'Mathematical modelling of contact dermatitis from nickel and chromium'
Supplementary information files for 'Mathematical modelling of contact dermatitis from nickel and chromium'
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Supplementary information files for 'Mathematical modelling of contact dermatitis from nickel and chromium'

CC BY-NC 4.0 ;DOI: 10.17028/rd.lboro.9913097.v1

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3
A modelling framework for airway epithelial fluid and ion transport with multiple cell types: implications for success or failure in gene therapies for cystic fibrosis
A modelling framework for airway epithelial fluid and ion transport with multiple cell types: implications for success or failure in gene therapies for cystic fibrosis
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A modelling framework for airway epithelial fluid and ion transport with multiple cell types: implications for success or failure in gene therapies for cystic fibrosis

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4
BK channel modulation as a theraputic target for Cystic Fibrosis
BK channel modulation as a theraputic target for Cystic Fibrosis
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BK channel modulation as a theraputic target for Cystic Fibrosis

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5
Depth profiling of ion-implanted 4H-SiC using confocal Raman spectroscopy: Poster presented at International Conference on Silicon Carbide & Related Materials, September 29th - October 04th, 2019, Kyoto, Japan
Depth profiling of ion-implanted 4H-SiC using confocal Raman spectroscopy: Poster presented at International Conference on Silicon Carbide & Related Materials, September 29th - October 04th, 2019, Kyoto, Japan
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Depth profiling of ion-implanted 4H-SiC using confocal Raman spectroscopy: Poster presented at International Conference on Silicon Carbide & Related Materials, September 29th - October 04th, 2019, Kyoto, Japan

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6
A TCAD Process Model with Monte Carlo Ion Implantation for 4H-SiC JBS Diode Analysis and Design: Poster presented at ICSCRM 2019, International Conference on Silicon Carbide and Related Materials, September 29 - October 4, 2019, Kyoto, Japan
A TCAD Process Model with Monte Carlo Ion Implantation for 4H-SiC JBS Diode Analysis and Design: Poster presented at ICSCRM 2019, International Conference on Silicon Carbide and Related Materials, September 29 - October 4, 2019, Kyoto, Japan
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A TCAD Process Model with Monte Carlo Ion Implantation for 4H-SiC JBS Diode Analysis and Design: Poster presented at ICSCRM 2019, International Conference on Silicon Carbide and Related Materials, September 29 - October 4, 2019, Kyoto, Japan

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7
Raman spectroscopy characterization of ion implanted 4H-SiC and its annealing effects: Poster presented at ECSCRM 2018, 12th European Conference on Silicon Carbide & Related Materials, September 2-6, 2018, Birmingham, UK
Raman spectroscopy characterization of ion implanted 4H-SiC and its annealing effects: Poster presented at ECSCRM 2018, 12th European Conference on Silicon Carbide & Related Materials, September 2-6, 2018, Birmingham, UK
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Raman spectroscopy characterization of ion implanted 4H-SiC and its annealing effects: Poster presented at ECSCRM 2018, 12th European Conference on Silicon Carbide & Related Materials, September 2-6, 2018, Birmingham, UK

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8
Ion De Sosa
Ion De Sosa
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Ion De Sosa

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9
Supplementary information files for 'Nanoscale investigation of deformation characteristics in a polycrystalline silicon carbide'
Supplementary information files for 'Nanoscale investigation of deformation characteristics in a polycrystalline silicon carbide'
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Supplementary information files for 'Nanoscale investigation of deformation characteristics in a polycrystalline silicon carbide'

CC BY-NC 4.0 ;DOI: 10.17028/rd.lboro.11394870.v1

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10
Experimental characterisation of FIB induced lateral damage on silicon carbide samples: Poster presented at MNE 2015, 41st International Conference on Micro and Nano Engineering, The Hague, The Netherlands, 21-24 September 2015
Experimental characterisation of FIB induced lateral damage on silicon carbide samples: Poster presented at MNE 2015, 41st International Conference on Micro and Nano Engineering, The Hague, The Netherlands, 21-24 September 2015
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Experimental characterisation of FIB induced lateral damage on silicon carbide samples: Poster presented at MNE 2015, 41st International Conference on Micro and Nano Engineering, The Hague, The Netherlands, 21-24 September 2015

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11
Ion Antonescu (1882 - 1946), Roemeens maarschalk en fascistisch / pro-nazi politicus, met gecamoufleerde periscoop tijdens de Tweede Wereldoorlog. 1941
Ion Antonescu (1882 - 1946), Roemeens maarschalk en fascistisch / pro-nazi politicus, met gecamoufleerde periscoop tijdens de Tweede Wereldoorlog. 1941
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Ion Antonescu (1882 - 1946), Roemeens maarschalk en fascistisch / pro-nazi politicus, met gecamoufleerde periscoop tijdens de Tweede Wereldoorlog. 1941

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12
Dress
Dress
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Dress

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13
Evaluation of resistless Ga+ beam lithography for UV-NIL stamp fabrication: Poster at 11th International Conference on Nanoimprint & Nanoprint Technology, October 24-26, 2012, Silverado Resort, Napa, California
Evaluation of resistless Ga+ beam lithography for UV-NIL stamp fabrication: Poster at 11th International Conference on Nanoimprint & Nanoprint Technology, October 24-26, 2012, Silverado Resort, Napa, California
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Evaluation of resistless Ga+ beam lithography for UV-NIL stamp fabrication: Poster at 11th International Conference on Nanoimprint & Nanoprint Technology, October 24-26, 2012, Silverado Resort, Napa, California

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14
Experimental observation of FIB induced lateral damage on silicon samples: Poster at 34th International Conference on Micro&Nano Engineering, MNE 2008, Athens
Experimental observation of FIB induced lateral damage on silicon samples: Poster at 34th International Conference on Micro&Nano Engineering, MNE 2008, Athens
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Experimental observation of FIB induced lateral damage on silicon samples: Poster at 34th International Conference on Micro&Nano Engineering, MNE 2008, Athens

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15
Doll
Doll
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Doll

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16
New dry-blend cathode manufacturing process for lithium-ion batteries: Poster presented at Battery + Storage 2013, Internationale Fachmesse für Batterie- und Energiespeicher-Technologien, 30.9.2013-2.10.2013 in Stuttgart
New dry-blend cathode manufacturing process for lithium-ion batteries: Poster presented at Battery + Storage 2013, Internationale Fachmesse für Batterie- und Energiespeicher-Technologien, 30.9.2013-2.10.2013 in Stuttgart
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New dry-blend cathode manufacturing process for lithium-ion batteries: Poster presented at Battery + Storage 2013, Internationale Fachmesse für Batterie- und Energiespeicher-Technologien, 30.9.2013-2.10.2013 in Stuttgart

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17
Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminum implanted 4H SiC: Poster at ECSCRM 2010, 8th European Conference on Silicon Carbide and Related Materials, 29.08.-02.09.2010, Oslo, Norway
Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminum implanted 4H SiC: Poster at ECSCRM 2010, 8th European Conference on Silicon Carbide and Related Materials, 29.08.-02.09.2010, Oslo, Norway
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Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminum implanted 4H SiC: Poster at ECSCRM 2010, 8th European Conference on Silicon Carbide and Related Materials, 29.08.-02.09.2010, Oslo, Norway

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18
Harta L-35-031-A-c
Harta L-35-031-A-c
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Harta L-35-031-A-c

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19
Accurate parameter extraction for the simulation of direct structuring by ion beams: Poster at MNE 2006, 32nd International Conference on Micro- and Nano- Engineering 2006, Barcelona, Spain
Accurate parameter extraction for the simulation of direct structuring by ion beams: Poster at MNE 2006, 32nd International Conference on Micro- and Nano- Engineering 2006, Barcelona, Spain
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Accurate parameter extraction for the simulation of direct structuring by ion beams: Poster at MNE 2006, 32nd International Conference on Micro- and Nano- Engineering 2006, Barcelona, Spain

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20
Simple and efficient method to fabricate nano-cone arrays by FIB milling demonstrated on planar substrates and on protruded structures: Poster at MNE 2011, 37th International Conference on Micro&Nano Engineering 2011, 19.09.-23.09.2011, Berlin, Germany
Simple and efficient method to fabricate nano-cone arrays by FIB milling demonstrated on planar substrates and on protruded structures: Poster at MNE 2011, 37th International Conference on Micro&Nano Engineering 2011, 19.09.-23.09.2011, Berlin, Germany
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Simple and efficient method to fabricate nano-cone arrays by FIB milling demonstrated on planar substrates and on protruded structures: Poster at MNE 2011, 37th International Conference on Micro&Nano Engineering 2011, 19.09.-23.09.2011, Berlin, Germany

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