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DIPAK K. DEY, JUN YAN, EDS. Extreme Value Modeling and Risk Analysis: Methods and Applications. Boca Raton: CRC Press
DIPAK K. DEY, JUN YAN, EDS. Extreme Value Modeling and Risk Analysis: Methods and Applications. Boca Raton: CRC Press
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DIPAK K. DEY, JUN YAN, EDS. Extreme Value Modeling and Risk Analysis: Methods and Applications. Boca Raton: CRC Press

Biometrics, 2017, Vol.73 (3), p.1057-1058 [Peer Reviewed Journal]

2017, The International Biometric Society ;ISSN: 0006-341X ;EISSN: 1541-0420 ;DOI: 10.1111/biom.12755

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