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1
Life-Cycle Assessment of Semiconductors
Life-Cycle Assessment of Semiconductors
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Life-Cycle Assessment of Semiconductors

Springer Science+Business Media, LLC 2012 ;ISBN: 9781441999870 ;ISBN: 1441999876 ;ISBN: 9781489992239 ;ISBN: 1489992235 ;EISBN: 1441999884 ;EISBN: 9781441999887 ;DOI: 10.1007/978-1-4419-9988-7 ;OCLC: 758362611

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2
Reinigung vor der Beschichtung
Reinigung vor der Beschichtung
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Reinigung vor der Beschichtung

Vakuum in Forschung und Praxis : Zeitschrift für Vakuumtechnologie, Oberflèachen und Dünne Schichten, 2013-02, Vol.25 (1), p.6-12

Copyright © 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim ;ISSN: 0947-076X ;EISSN: 1522-2454 ;DOI: 10.1002/vipr.201300514

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3
Post-Silicon and Runtime Verification for Modern Processors
Post-Silicon and Runtime Verification for Modern Processors
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Post-Silicon and Runtime Verification for Modern Processors

Springer Science+Business Media, LLC 2011 ;ISBN: 1441980334 ;ISBN: 9781441980335 ;ISBN: 1489981500 ;ISBN: 9781489981509 ;EISBN: 1441980342 ;EISBN: 9781441980342 ;DOI: 10.1007/978-1-4419-8034-2 ;OCLC: 695386957

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4
Lead-Free Conductors with a Surface Treatment Ensuring a Low Melting Temperature
Lead-Free Conductors with a Surface Treatment Ensuring a Low Melting Temperature
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Lead-Free Conductors with a Surface Treatment Ensuring a Low Melting Temperature

Periodica polytechnica. Transportation engineering, 2024-04, Vol.52 (2), p.134 [Peer Reviewed Journal]

Copyright Periodica Polytechnica, Budapest University of Technology and Economics 2024 ;ISSN: 0303-7800 ;EISSN: 1587-3811 ;DOI: 10.3311/PPtr.22876

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5
Introduction to Hardware Security and Trust
Introduction to Hardware Security and Trust
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Introduction to Hardware Security and Trust

Springer Science+Business Media, LLC 2012 ;ISBN: 1441980792 ;ISBN: 9781441980793 ;ISBN: 1489990364 ;ISBN: 9781489990365 ;EISBN: 1441980806 ;EISBN: 9781441980809 ;DOI: 10.1007/978-1-4419-8080-9 ;OCLC: 757539159

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6
Communication Performance vs. Implementation Trade-offs of Interpolation Techniques for FFT-Based Carrier Synchronization exemplified on DVB-RCS2
Communication Performance vs. Implementation Trade-offs of Interpolation Techniques for FFT-Based Carrier Synchronization exemplified on DVB-RCS2
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Communication Performance vs. Implementation Trade-offs of Interpolation Techniques for FFT-Based Carrier Synchronization exemplified on DVB-RCS2

Advances in radio science, 2021-12, Vol.19, p.59-70 [Peer Reviewed Journal]

COPYRIGHT 2021 Copernicus GmbH ;2021. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 1684-9973 ;ISSN: 1684-9965 ;EISSN: 1684-9973 ;DOI: 10.5194/ars-19-59-2021

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7
Confined Raman Scattering - Easy Access to the Surface Phonons of Specific Crystalline Solids
Confined Raman Scattering - Easy Access to the Surface Phonons of Specific Crystalline Solids
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Confined Raman Scattering - Easy Access to the Surface Phonons of Specific Crystalline Solids

Zeitschrift für anorganische und allgemeine Chemie (1950), 2015-08, Vol.641 (10), p.1835-1844 [Peer Reviewed Journal]

Copyright © 2015 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim ;Copyright © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim ;ISSN: 0044-2313 ;EISSN: 1521-3749 ;DOI: 10.1002/zaac.201500142

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8
FPGA Implementations of Neural Networks
FPGA Implementations of Neural Networks
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FPGA Implementations of Neural Networks

Springer 2006 ;ISBN: 0387284850 ;ISBN: 9780387284859 ;EISBN: 0387284877 ;EISBN: 9780387284873 ;DOI: 10.1007/0-387-28487-7 ;OCLC: 401431945

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9
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
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Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

Springer Science+Business Media, LLC 2011 ;ISBN: 9781441967145 ;ISBN: 1441967141 ;ISBN: 9781489985941 ;ISBN: 1489985948 ;ISBN: 144196715X ;ISBN: 9781441967152 ;EISBN: 144196715X ;EISBN: 9781441967152 ;DOI: 10.1007/978-1-4419-6715-2 ;OCLC: 760976223 ;LCCallNum: TK7870.23 .D46 2011eb

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10
Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
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Power Distribution Networks with On-Chip Decoupling Capacitors

Springer Science+Business Media, LLC 2011 ;ISBN: 1441978704 ;ISBN: 9781441978707 ;ISBN: 1489982329 ;ISBN: 9781489982322 ;EISBN: 9781441978714 ;EISBN: 1441978712 ;DOI: 10.1007/978-1-4419-7871-4 ;OCLC: 695386956

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11
System-Level Validation: High-Level Modeling and Directed Test Generation Techniques
System-Level Validation: High-Level Modeling and Directed Test Generation Techniques
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System-Level Validation: High-Level Modeling and Directed Test Generation Techniques

Springer Science+Business Media New York 2013 ;ISBN: 1461413591 ;ISBN: 9781461413592 ;ISBN: 1461413583 ;ISBN: 9781461413585 ;EISBN: 1461413591 ;EISBN: 9781461413592 ;DOI: 10.1007/978-1-4614-1359-2 ;OCLC: 811840480

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12
Fast post-Doppler STAP with road map for traffic monitoring: overview and first results
Fast post-Doppler STAP with road map for traffic monitoring: overview and first results
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Article 		Add to My Research

Fast post-Doppler STAP with road map for traffic monitoring: overview and first results

Advances in radio science, 2019-09, Vol.17, p.137-143 [Peer Reviewed Journal]

COPYRIGHT 2019 Copernicus GmbH ;2019. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 1684-9973 ;ISSN: 1684-9965 ;EISSN: 1684-9973 ;DOI: 10.5194/ars-17-137-2019

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13
Worst-Case Execution Time Aware Compilation Techniques for Real-Time Systems
Worst-Case Execution Time Aware Compilation Techniques for Real-Time Systems
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Worst-Case Execution Time Aware Compilation Techniques for Real-Time Systems

Springer Science+Business Media B.V. 2011 ;ISSN: 2193-0155 ;ISBN: 904819928X ;ISBN: 9789048199280 ;EISBN: 9789048199297 ;EISBN: 9048199298 ;DOI: 10.1007/978-90-481-9929-7 ;OCLC: 694143485

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14
Novel post-Doppler STAP with a priori knowledge information for traffic monitoring applications: basic idea and first results
Novel post-Doppler STAP with a priori knowledge information for traffic monitoring applications: basic idea and first results
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Article 		Add to My Research

Novel post-Doppler STAP with a priori knowledge information for traffic monitoring applications: basic idea and first results

Advances in radio science, 2017-09, Vol.15, p.77-82 [Peer Reviewed Journal]

COPYRIGHT 2017 Copernicus GmbH ;Copyright Copernicus GmbH 2017 ;2017. This work is published under https://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 1684-9973 ;ISSN: 1684-9965 ;EISSN: 1684-9973 ;DOI: 10.5194/ars-15-77-2017

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15
FPGA implementation of logarithmic versions of Baum-Welch and Viterbi algorithms for reduced precision hidden Markov models
FPGA implementation of logarithmic versions of Baum-Welch and Viterbi algorithms for reduced precision hidden Markov models
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FPGA implementation of logarithmic versions of Baum-Welch and Viterbi algorithms for reduced precision hidden Markov models

Bulletin of the Polish Academy of Sciences. Technical sciences, 2017-12, Vol.65 (6), p.935-947 [Peer Reviewed Journal]

2017. This work is published under http://creativecommons.org/licenses/by-nc-nd/4.0 (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2300-1917 ;ISSN: 0239-7528 ;EISSN: 2300-1917 ;DOI: 10.1515/bpasts-2017-0101

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16
Ultra-thin Chip Technology and Applications
Ultra-thin Chip Technology and Applications
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Ultra-thin Chip Technology and Applications

Springer Science+Business Media, LLC 2011 ;ISBN: 9781441972750 ;ISBN: 1441972757 ;EISBN: 1441972765 ;EISBN: 9781441972767 ;DOI: 10.1007/978-1-4419-7276-7 ;OCLC: 695387358

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17
Reconfigurable Switched-Capacitor Power Converters: Principles and Designs for Self-Powered Microsystems
Reconfigurable Switched-Capacitor Power Converters: Principles and Designs for Self-Powered Microsystems
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Reconfigurable Switched-Capacitor Power Converters: Principles and Designs for Self-Powered Microsystems

Springer Science+Business Media New York 2013 ;ISBN: 9781461441861 ;ISBN: 9781461441878 ;ISBN: 1461441870 ;ISBN: 1461441862 ;EISBN: 9781461441878 ;EISBN: 1461441870 ;DOI: 10.1007/978-1-4614-4187-8 ;OCLC: 802844137 ;LCCallNum: TK7872.C8 M3 2013eb

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18
CPU Design: Answers to Frequently Asked Questions: Answers to Frequently Asked Questions
CPU Design: Answers to Frequently Asked Questions: Answers to Frequently Asked Questions
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CPU Design: Answers to Frequently Asked Questions: Answers to Frequently Asked Questions

ISBN: 9780387237992 ;ISBN: 0387237992 ;EISBN: 038723800X ;EISBN: 9780387238005

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19
High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
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Book 		Add to My Research

High Quality Test Pattern Generation and Boolean Satisfiability

Springer Science+Business Media, LLC 2012 ;ISBN: 9781441999757 ;ISBN: 1441999752 ;ISBN: 1489988475 ;ISBN: 9781489988478 ;EISBN: 9781441999764 ;EISBN: 1441999760 ;DOI: 10.1007/978-1-4419-9976-4 ;OCLC: 785779244

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20
Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
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Design for Manufacturability and Yield for Nano-Scale CMOS

Springer 2007 ;ISSN: 1558-9412 ;ISBN: 1402051875 ;ISBN: 9781402051876 ;EISSN: 1558-9420 ;EISBN: 1402051883 ;EISBN: 9781402051883 ;DOI: 10.1007/978-1-4020-5188-3 ;OCLC: 209944733

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