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A Lognormal Model for Response Times on Test Items

Journal of educational and behavioral statistics, 2006-06, Vol.31 (2), p.181-204 [Peer Reviewed Journal]

Copyright 2006 American Educational Research Association and the American Statistical Association ;Copyright American Educational Research Association Summer 2006 ;ISSN: 1076-9986 ;EISSN: 1935-1054 ;DOI: 10.3102/10769986031002181

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Title:
A Lognormal Model for Response Times on Test Items
Author: van der Linden, Wim J.
Subjects: Armed Services Vocational Aptitude Battery ; Behavior ; Datasets ; Discrimination Parameters ; Gaussian distributions ; Goodness of Fit ; Item Response Theory ; Logistics ; Markov Processes ; Mathematical independent variables ; Modeling ; Monte Carlo Methods ; Multilevel models ; Parametric models ; Predictive modeling ; Psychology ; Reaction Time ; Response time ; Statistical variance ; Studies ; Test Items ; Test Validity ; Testing ; Tests ; Vocational Aptitude
Is Part Of: Journal of educational and behavioral statistics, 2006-06, Vol.31 (2), p.181-204
Description: A lognormal model for the response times of a person on a set of test items is investigated. The model has a parameter structure analogous to the two-parameter logistic response models in item response theory, with a parameter for the speed o? each person as well as parameters for the time intensity and discriminating power of each item. It is shown how these parameters can be estimated by a Markov chain Monte Carlo method (Gibbs sampler). The method was used to analyze response times for the adaptive version of a test from the Armed Services Vocational Aptitude Battery. The same data set was used to test the validity of the model against a normal model using posterior predictive checks on the response times. The lognormal model showed an excellent fit to the data, whereas the normal model seemed unable to allow for a characteristic skewness of the response time distributions. The addition of an equality constraint on the discrimination parameters led only to a slight loss of fit. The potential use of the model for improving the daily practice of testing is indicated.
Publisher: Los Angeles, CA: American Educational Research Association and American Statistical Association
Language: English
Identifier: ISSN: 1076-9986
EISSN: 1935-1054
DOI: 10.3102/10769986031002181
Source: ProQuest One Psychology
Education Resources Information Center (ERIC)
AUTh Library subscriptions: ProQuest Central
Alma/SFX Local Collection

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A Lognormal Model for Response Times on Test Items

Copyright 2006 American Educational Research Association and the American Statistical Association ;Copyright American Educational Research Association Summer 2006 ;ISSN: 1076-9986 ;EISSN: 1935-1054 ;DOI: 10.3102/10769986031002181

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