Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data"

Machine learning: science and technology, 2023-07 [Peer Reviewed Journal]

2023. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;http://arxiv.org/licenses/nonexclusive-distrib/1.0 ;Distributed under a Creative Commons Attribution 4.0 International License ;EISSN: 2331-8422 ;EISSN: 2632-2153 ;DOI: 10.48550/arxiv.2307.06322

Full text available