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Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO 2 thin films

Journal of applied physics, 2023-04, Vol.133 (13) [Peer Reviewed Journal]

Distributed under a Creative Commons Attribution 4.0 International License ;ISSN: 0021-8979 ;EISSN: 1089-7550 ;DOI: 10.1063/5.0136229

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