skip to main content
Language:
Search Limited to: Search Limited to: Resource type Show Results with: Show Results with: Search type Index

A new method for current–voltage curve prediction in photovoltaic modules

IET renewable power generation, 2021-04, Vol.15 (6), p.1331-1343 [Peer Reviewed Journal]

2021 The Authors. published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology ;ISSN: 1752-1416 ;EISSN: 1752-1424 ;DOI: 10.1049/rpg2.12110

Full text available

Citations Cited by
  • Title:
    A new method for current–voltage curve prediction in photovoltaic modules
  • Author: Peña, Rafael ; Diez‐Pascual, Ana M. ; Díaz, Pilar García ; Davoise, Lara Velasco
  • Subjects: Interpolation and function approximation (numerical analysis) ; Photoelectric conversion; solar cells and arrays ; Solar cells and arrays
  • Is Part Of: IET renewable power generation, 2021-04, Vol.15 (6), p.1331-1343
  • Description: In this work, a new method for obtaining the current–voltage curve for crystalline silicon and thin‐film flat panels is presented. It is based on the single‐diode model, with a variable shunt resistance and series resistance. New expressions for the shunt resistance and open circuit voltage as a function of the temperature and irradiance are deduced. Besides, a procedure to translate the series resistance to arbitrary conditions is proposed. The diode ideality factor and shunt resistance are obtained by optimization. The rest of the parameters that appear in the current–voltage curve are obtained from the module measurements by means of theoretical expressions. The procedure for obtaining the current–voltage curve under arbitrary operating conditions is also described. The results obtained with the developed model are compared with experimental measurements in cadmium telluride and amorphous silicon modules, and with results published in the literature for other technologies. The model faithfully reproduces the experimental values. For all the modules, the root mean square error for the maximum power is lower than 2% (below 1.5% in most cases). These errors are lower than those reported in the literature for other models. In particular, the results are significantly more exact in the case of thin‐film modules.
  • Publisher: Wiley
  • Language: English
  • Identifier: ISSN: 1752-1416
    EISSN: 1752-1424
    DOI: 10.1049/rpg2.12110
  • Source: DOAJ Directory of Open Access Journals
Back to results list
INSPIRE LIBRARY - TON DUC THANG UNIVERSITY (84-028) 37 755 057 Feedback
19 Nguyen Huu Tho St. Dist.7, HCM thuvien@tdtu.edu.vn

Copyright © 2017 INSPIRE LIBRARY - TON DUC THANG UNIVERSITY

Searching Remote Databases, Please Wait