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Mulberry Leaf Yield Prediction Using Machine Learning Techniques

arXiv.org, 2021-09

2021. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;http://arxiv.org/licenses/nonexclusive-distrib/1.0 ;EISSN: 2331-8422 ;DOI: 10.48550/arxiv.2110.01394

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  • Title:
    Mulberry Leaf Yield Prediction Using Machine Learning Techniques
  • Author: Srikantaiah, K C ; Deeksha, A
  • Subjects: Agricultural production ; Algorithms ; Computer Science - Learning ; Crops ; Machine learning ; Nutrients ; Regression ; Silk ; Silkworms ; Soils
  • Is Part Of: arXiv.org, 2021-09
  • Description: Soil nutrients are essential for the growth of healthy crops. India produces a humungous quantity of Mulberry leaves which in turn produces the raw silk. Since the climatic conditions in India is favourable, Mulberry is grown throughout the year. Majority of the farmers hardly pay attention to the nature of soil and abiotic factors due to which leaves become malnutritious and thus when they are consumed by the silkworm, desired quality end-product, raw silk, will not be produced. It is beneficial for the farmers to know the amount of yield that their land can produce so that they can plan in advance. In this paper, different Machine Learning techniques are used in predicting the yield of the Mulberry crops based on the soil parameters. Three advanced machine-learning models are selected and compared, namely, Multiple linear regression, Ridge regression and Random Forest Regression (RF). The experimental results show that Random Forest Regression outperforms other algorithms.
  • Publisher: Ithaca: Cornell University Library, arXiv.org
  • Language: English
  • Identifier: EISSN: 2331-8422
    DOI: 10.48550/arxiv.2110.01394
  • Source: arXiv.org
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