Publisher’s Note: “Dynamic behavior of helium bubbles at high temperature in Si studied by in situ TEM, STEM-EELS, and TDS” [J. Appl. Phys. 126, 135104 (2019)]
Journal of applied physics, 2019-11, Vol.126 (19) [Peer Reviewed Journal]Author(s) ;2019 Author(s). Published under license by AIP Publishing. ;ISSN: 0021-8979 ;EISSN: 1089-7550 ;DOI: 10.1063/1.5134061 ;CODEN: JAPIAU
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