Language:

Critical assessment of charge mobility extraction in FETs

Nature materials, 2017-12, Vol.17 (1), p.2-7 [Peer Reviewed Journal]

Full text available

Citations Cited by

Title:
Critical assessment of charge mobility extraction in FETs
Author: Choi, Hyun Ho ; Cho, Kilwon ; Frisbie, C Daniel ; Sirringhaus, Henning ; Podzorov, Vitaly
Subjects: Electric fields ; Materials research ; Semiconductors ; Transistors
Is Part Of: Nature materials, 2017-12, Vol.17 (1), p.2-7
Publisher: England: Nature Publishing Group
Language: English
Identifier: ISSN: 1476-1122
EISSN: 1476-4660
DOI: 10.1038/nmat5035
PMID: 29255225
Source: ProQuest Central

Back to results list


INSPIRE LIBRARY - TON DUC THANG UNIVERSITY	(84-028) 37 755 057	Feedback
19 Nguyen Huu Tho St. Dist.7, HCM	thuvien@tdtu.edu.vn	Feedback

Searching Remote Databases, Please Wait