Exploring best-matched embedding model and classifier for charging-pile fault diagnosis

Cybersecurity (Singapore), 2023-12, Vol.6 (1), p.7-13, Article 7 [Peer Reviewed Journal]

The Author(s) 2023 ;The Author(s) 2023. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. ;ISSN: 2523-3246 ;EISSN: 2523-3246 ;DOI: 10.1186/s42400-023-00138-z

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