Language:

Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors

Journal of applied crystallography, 2009-12, Vol.42 (6), p.1030-1034 [Peer Reviewed Journal]

Full text available

Citations Cited by

Title:
Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors
Author: Smilgies, Detlef-M.
Subjects: Finite element analysis ; Grain size ; grazing-incidence small-angle scattering (GISAXS) ; grazing-incidence wide-angle scattering (GIWAXS) ; Research Papers ; Scattering ; Scherrer formula ; soft materials ; thin films
Is Part Of: Journal of applied crystallography, 2009-12, Vol.42 (6), p.1030-1034
Description: Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X‐ray scattering. Various aspects of Scherrer‐type grain‐size analysis are discussed with regard to the characterization of thin films with grazing‐incidence scattering methods utilizing area detectors. After a brief review of the basic features of Scherrer analysis, a description of resolution‐limiting factors in grazing‐incidence scattering geometry is provided. As an application, the CHESS D1 beamline is characterized for typical scattering modes covering length scales from the molecular scale to the nanoscale.
Publisher: 5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography
Language: English
Identifier: ISSN: 1600-5767
ISSN: 0021-8898
EISSN: 1600-5767
DOI: 10.1107/S0021889809040126
PMID: 19953189
Source: Alma/SFX Local Collection

Back to results list


INSPIRE LIBRARY - TON DUC THANG UNIVERSITY	(84-028) 37 755 057	Feedback
19 Nguyen Huu Tho St. Dist.7, HCM	thuvien@tdtu.edu.vn	Feedback

Searching Remote Databases, Please Wait